Metrology for Nanotechnology
Ambios Q-View
In an industry first Ambios Technology has released Q-View™ which incorporates Optical Profiling & AFM on the same platform. This brings the“point-and-shoot” speed and ease-of-use of a microinterferometer to the scanning probe microscope platform in a single, fully integrated instrument. Move seamlessly between the interferometer module and the AFM scanner. Now you can have the best of both worlds - capture a 500μm image in seconds then switch to AFM-mode for high resolution sub-angstrom characterization.
Group Scientific now represents Hecus X-Ray systems.
Hecus is the leader in X-Ray scattering metrology for R & D. The new S3-Micro system brings exceptional SAXS/WAXS performance to the laboratory bench top. If nanostructure is important to you, contact us for details and pricing.
